Atomic Force Microscope (AFM)
Surface Characterization / Nanotechnology
Surface Topography Analysis using an Atomic Force Microscope (AFM) is a high-resolution, non-destructive characterization technique used to obtain three-dimensional (3D) surface images and quantitative nanoscale measurements. AFM enables precise evaluation of surface roughness, particle size, grain morphology, height profiles, and nanostructures without requiring conductive coatings, making it ideal for advanced materials research and quality control. Atomic Force Microscopy (AFM) employs a sharp nanoscale probe mounted on a flexible cantilever to scan the sample surface. As the probe interacts with the surface through atomic forces, the cantilever deflects, and a laser detection system records these deflections to generate high-resolution three-dimensional surface images. Unlike electron microscopy, AFM provides true surface height measurements with nanometer-scale vertical resolution and can analyze conductive as well as non-conductive materials under ambient conditions. AFM is widely used for studying thin films, nanomaterials, semiconductors, polymers, biomaterials, coatings, MEMS devices, and advanced functional materials.
Test specification
- Methodology
- Contact Mode AFM - Tapping Mode AFM - Non-Contact Mode AFM - Surface Height Mapping - 3D Surface Imaging - Line Profile Analysis - Roughness Analysis - Image Processing & Quantitative Analysis
- Standards followed
- ISO 25178 Series – Areal Surface Texture - ISO 4287 – Surface Texture Profile Method - ASTM E2530 – Standard Guide for Nanoscale Measurements - ASTM E2859 – Surface Roughness Characterization by Scanning Probe Microscopy - ISO/IEC 17025 Laboratory Practices
- Equipment used
- Atomic Force Microscope (AFM) - Laser Detection System - Piezoelectric Scanner - AFM Probe & Cantilever - Vibration Isolation Table - AFM Image Processing Software
- Parameters measured
- Surface Roughness (Ra) - RMS Roughness (Rq) - Average Height - Maximum Peak Height - Valley Depth - Step Height - Surface Profile - Particle Size - Grain Size - Surface Morphology - 3D Topography - Line Profile - Surface Area - Height Distribution
- Measurement range
- Scan Area: 1 µm × 1 µm to 100 µm × 100 µm
- Vertical Resolution: <0.1 nm
- Lateral Resolution: 1–20 nm
- Accuracy / detection limit
- Vertical Accuracy: sub-nanometer (<0.1 nm)
- Lateral Accuracy: typically ±1–5 nm
- Minimum Feature Size: approx. 1–5 nm
Suitability
- Applications
- - Surface Roughness Measurement - Nanostructure Characterization - Thin Film Analysis - Particle Size Analysis - Grain Morphology Evaluation - Semiconductor Surface Inspection - MEMS/NEMS Research - Coating Surface Evaluation - Polymer Surface Analysis - Biomaterial Characterization - Battery Material Research - Nanotechnology Research - Failure Analysis - Quality Control
- Industries served
- - Universities & Research Institutions - Semiconductor Industry - Nanotechnology Laboratories - Electronics Industry - Biomedical Industry - Polymer Industry - Pharmaceutical Industry - Coating & Paint Industry - Energy Storage Industry - MEMS Manufacturing - Surface Engineering Companies - Quality Control Laboratories
- Advantages
- True three-dimensional nanoscale surface imaging. - Extremely high vertical resolution (<0.1 nm). - Non-destructive characterization. - Suitable for conductive and non-conductive materials. - No conductive coating required. - Quantitative surface roughness measurement. - Operates under ambient conditions. - Ideal for nanotechnology, semiconductor, and biomaterial research.
- Limitations
- Limited scan area compared to optical microscopy. - Imaging speed is relatively slow. - Probe wear may affect image quality. - Soft or sticky samples may require specialized probes. - Large surface roughness can reduce image accuracy.
Submitting a sample
- Sample requirement
- Samples should be clean, dry, and free from dust or oil contamination. - Flat, rigid surfaces are preferred for optimum imaging. - Typical sample dimensions should fit within the AFM sample stage. - Samples should be firmly mounted on the specimen holder. - Highly loose powders may require special mounting techniques. - Magnetic or soft materials should be declared before testing.
- Turnaround time
- Standard Analysis: 3–7 Working Days
- Priority Service: 24–48 Hours (Subject to availability)
- Deliverables
- Official AFM Analysis Report - 2D Surface Images - 3D Surface Topography Images - Surface Roughness Results - Height Profile Analysis - Particle/Grain Size Results (if applicable) - Surface Morphology Interpretation - PDF Report - Optional Raw Image Files
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