External Quantum Efficiency (EQE) Measurement
Optoelectronic Characterization / Photovoltaic Testing
External Quantum Efficiency (EQE) Measurement is a high-precision optical characterization technique used to determine the wavelength-dependent photoresponse of photovoltaic devices, photodetectors, LEDs, and semiconductor materials. The test measures the efficiency with which incident photons are converted into charge carriers and collected as electrical current, providing valuable information on device performance, optical losses, and spectral response. The Quantum Efficiency (QE) Measurement System evaluates the spectral response of optoelectronic devices by illuminating the sample with monochromatic light over a defined wavelength range. The generated photocurrent is measured and compared with the incident photon flux to calculate the External Quantum Efficiency (EQE). EQE analysis provides insight into photon absorption, carrier generation, charge collection efficiency, recombination losses, and wavelength-dependent device performance. It is an essential characterization tool for photovoltaic research, semiconductor device development, photodetector optimization, and quality assurance.
Test specification
- Methodology
- Monochromatic Light Illumination - Spectral Response Measurement - Photocurrent Detection - Reference Detector Calibration - External Quantum Efficiency (EQE) Calculation - Wavelength Scanning - Spectral Data Processing
- Standards followed
- IEC 60904-8 – Measurement of Spectral Responsivity of Photovoltaic Devices - IEC 60904-7 – Spectral Mismatch Correction - ASTM E1021 – Spectral Responsivity Measurements - ASTM E2236 – Spectral Irradiance Calibration - ISO/IEC 17025 Laboratory Practices
- Equipment used
- Quantum Efficiency (QE) Measurement System - Monochromator - Broadband Light Source (Xenon/Halogen Lamp) - Optical Chopper - Lock-in Amplifier - Reference Silicon Photodiode - Precision Source Meter - Optical Fiber Assembly - Computer-Controlled Data Acquisition Software
- Parameters measured
- External Quantum Efficiency (EQE) - Spectral Response - Responsivity (A/W) - Photocurrent - Incident Photon Flux - Wavelength Response - Short-Circuit Current Density (Jsc) (Calculated) - Cut-off Wavelength - Peak Quantum Efficiency - Optical Conversion Efficiency
- Measurement range
- Wavelength: 300–1100 nm
- Quantum Efficiency: 0–100% (or higher for special devices)
- Spectral Resolution: 1–5 nm
- Accuracy / detection limit
- Wavelength Accuracy: ±0.5–1 nm
- Quantum Efficiency Accuracy: ±2–3%
- Photocurrent Resolution: pA–nA level
Suitability
- Applications
- - Solar Cell Characterization - Photovoltaic Device Evaluation - Perovskite Solar Cell Research - Silicon Solar Cell Testing - Thin Film Solar Cell Analysis - Photodetector Characterization - LED Performance Evaluation - Semiconductor Device Research - Optical Material Development - Nanomaterial Optoelectronics - Academic Research - Quality Control
- Industries served
- - Universities & Research Institutions - Solar Cell Manufacturers - Semiconductor Industry - Optoelectronics Industry - LED Manufacturing - Renewable Energy Industry - Photodetector Manufacturers - Research & Development Organizations - Advanced Materials Industry - Quality Control Laboratories
- Advantages
- Non-destructive characterization technique. - High spectral resolution. - Accurate wavelength-dependent photoresponse measurement. - Essential for photovoltaic device optimization. - Enables calculation of theoretical short-circuit current. - Suitable for research, development, and quality assurance. - Internationally accepted optoelectronic characterization method.
- Limitations
- Samples require stable electrical contacts. - Optical alignment is critical for accurate measurements. - Measurements are influenced by ambient light if not properly controlled. - Some devices require specialized sample holders. - Internal Quantum Efficiency (IQE) requires additional reflectance/transmittance measurements.
Submitting a sample
- Sample requirement
- Samples should be clean and free from dust or fingerprints. - Electrical contacts should be properly prepared. - Active device area should be clearly identified. - Samples should be stable under room-temperature testing conditions. - Devices should be compatible with the sample holder. - Encapsulated or unencapsulated devices may be tested depending on system configuration.
- Turnaround time
- Standard Analysis: 3–7 Working Days
- Priority Service: 24–48 Hours (Subject to availability)
- Deliverables
- Official QE Measurement Report - External Quantum Efficiency (EQE) Curve - Spectral Response Graph - Responsivity Plot - Calculated Short-Circuit Current Density (Jsc) - Wavelength Response Data - PDF Report - Optional Raw Data Files - Data Interpretation (Optional)
Request this test
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