Field Emission Scanning Electron Microscope (FESEM)
Materials Characterization
Starting from৳11,456
All services
FESEM provides ultra-high-resolution imaging for studying surface morphology, microstructure, particle size, grain boundaries, fractures, coatings, and defects. With an EDS detector, qualitative and semi-quantitative elemental composition can also be determined.
Test specification
- Methodology
- Field Emission Scanning Electron Microscopy (FESEM)
- Secondary Electron Imaging (SE)
- Backscattered Electron Imaging (BSE)
- Standards followed
- ASTM E766
- ASTM E986
- ASTM E1508
- ISO 16700
- ISO 22309 (where applicable)
- Equipment used
- FESEM
- Secondary Electron Detector
- Backscattered Electron Detector
- Motorized Specimen Stage
- High Vacuum System
- Parameters measured
- Surface morphology
- particle shape/size
- grain size/distribution
- surface defects
- surface roughness (qualitative)
- crack formation
- fracture features
- porosity
- coating thickness (cross-sectional)
- fiber diameter
- layer structure
- Measurement range
- Magnification 20x-1,000,000x
- Accelerating Voltage 0.5-30 kV
- Working Distance 1-40 mm
- Resolution <=1.5 nm
- Accuracy / detection limit
- Imaging Resolution: <=1.5 nm
- Image Magnification Accuracy: as per manufacturer specification
Suitability
- Applications
- Materials ScienceMetallurgical EngineeringMechanical EngineeringNanotechnologySemiconductor ResearchBattery MaterialsComposite MaterialsPolymer EngineeringBiomedical MaterialsThin Film TechnologyCorrosion EngineeringFailure InvestigationAdditive ManufacturingGeological Materials
- Industries served
- UniversitiesResearch InstitutesSteel IndustryCement IndustryCeramic IndustryElectronics IndustryPharmaceutical IndustryEnergy SectorAerospaceAutomotiveTextile Industry
- Advantages
- Ultra-high spatial resolution
- non-destructive characterization
- excellent depth of field
- rapid analysis
- suitable for micro- and nanomaterials
- Limitations
- Non-conductive samples require conductive coating
- samples must fit within the specimen chamber
- FESEM does not directly identify crystal phases (XRD recommended for phase analysis)
Submitting a sample
- Sample requirement
- Sample should be clean and dry
- loose contamination removed
- non-conductive samples require Au/Pt/Carbon coating
- maximum dimensions depend on specimen chamber capacity
- cross-sectional samples should be properly polished when required
- Turnaround time
- Standard Service: 3-5 Working Days
- Urgent Service: 24-48 Hours (subject to availability)
- Deliverables
- High-resolution FESEM images
- PDF test report
- TIFF images
- JPEG images
- observation summary
- interpretation (optional)
Request this test
Send us your sample details and we'll confirm scope and timing.