Phase Identification using X-Ray Diffraction (XRD) is a non-destructive analytical technique used to identify and characterize the crystalline phases present in a material. Each crystalline substance produces a unique diffraction pattern, allowing accurate identification through comparison with the International Centre for Diffraction Data (ICDD) Powder Diffraction File (PDF) database. This analysis is essential for material characterization, quality assurance, research, and industrial process optimization. Phase Identification by XRD is one of the most widely used analytical techniques in materials science for determining the crystalline composition of unknown and known materials. During analysis, monochromatic X-rays interact with the crystal lattice of the sample, producing characteristic diffraction peaks. These diffraction patterns are matched with the ICDD Powder Diffraction File (PDF) database to identify the crystalline phases present. The technique enables the detection of single-phase and multi-phase materials and provides valuable information regarding crystal structure, polymorphism, impurities, and phase transformations. It is extensively applied in metallurgy, ceramics, cement, geology, nanotechnology, pharmaceuticals, battery materials, catalysts, and advanced materials research.
Test specification
- Methodology
- X-Ray Diffraction (XRD) - Bragg-Brentano (θ–2θ) Geometry - Phase identification through diffraction pattern matching - Search-Match analysis using the ICDD Powder Diffraction File (PDF) database - Optional qualitative and semi-quantitative phase analysis
- Standards followed
Testing is performed in accordance with internationally recognized standards where applicable, including: - ASTM E975 – Standard Practice for X-Ray Determination of Crystalline Phases - ASTM D3906 – Standard Test Method for XRD Analysis - ASTM C1365 – Determination of Crystalline Phases in Cementitious Materials - ISO 13067 – X-Ray Diffraction Analysis - ICDD Powder Diffraction File (PDF) Database
- Equipment used
- Floor Top X-Ray Diffractometer (XRD) - Cu Kα X-ray Radiation Source (λ = 1.5406 Å) - High-Precision Goniometer - Solid-State X-ray Detector - Integrated XRD Analysis Software - ICDD PDF Database
- Parameters measured
- Diffraction Pattern - Peak Position (2θ) - Peak Intensity - d-Spacing - Crystal Phase - Crystal Structure - Relative Phase Abundance - Peak Width (FWHM) - Crystallinity (Qualitative) - Preferred Orientation (Qualitative)
- Measurement range
| Parameter | Typical Range | ||| | Scan Range | 5°–90° (2θ) | | Step Size | 0.005°–0.02° | | X-ray Wavelength | Cu Kα (1.5406 Å) | | Detectable Materials | Crystalline Materials | | Sample Form | Powder, Bulk, Thin Film |
- Accuracy / detection limit
- Angular Accuracy: **±0.01° (2θ)** - High repeatability with automated instrument calibration. - Reliable phase identification using the ICDD reference database. - Approximately **1–3 wt.%** crystalline phase under normal analytical conditions. - Detection capability depends on sample crystallinity, phase abundance, and measurement conditions.
Suitability
- Applications
- - Phase identification of unknown materials - Quality control of raw materials and finished products - Mineralogical analysis - Cement and clinker characterization - Ceramic material analysis - Alloy verification - Battery material characterization - Catalyst identification - Pharmaceutical polymorph identification - Nanomaterial characterization - Thin film characterization - Failure analysis - Corrosion product identification - Research and development
- Industries served
- - Universities & Research Institutions - Steel & Metallurgical Industries - Cement Industry - Ceramic Industry - Mining & Mineral Processing - Geological Survey Organizations - Pharmaceutical Industry - Chemical Industry - Electronics Industry - Battery & Energy Storage Industry - Aerospace Industry - Automotive Industry - Advanced Manufacturing
- Advantages
- Non-destructive analytical technique. - Rapid and reliable phase identification. - High analytical accuracy and repeatability. - Suitable for qualitative and semi-quantitative analysis. - Minimal sample preparation. - Applicable to a wide range of crystalline materials. - Internationally accepted characterization method. - Essential for research, quality control, and product development.
- Limitations
- Amorphous materials cannot be directly identified. - Very low concentration phases (<1 wt.%) may not be detected. - Requires crystalline material for successful analysis. - Phase identification accuracy depends on database availability. - Sample preparation quality significantly affects results.
Submitting a sample
- Sample requirement
- Sample should be clean, dry, and free from contaminants. - Powder samples should be finely ground and homogeneous (preferably <75 μm particle size). - Recommended powder quantity: **0.5–2 g**. - Bulk samples should have a flat and smooth surface. - Thin film samples must be firmly mounted on a suitable substrate. - Moisture-sensitive samples should be submitted in airtight containers.
- Turnaround time
| Service | Estimated Time | |-|-| | Standard Analysis | 3–5 Working Days | | Priority Service | 24–48 Hours (Subject to availability) |
- Deliverables
Clients will receive: - Official XRD Test Report - XRD Diffractogram - Identified Crystal Phases - Peak List - Phase Matching Results - PDF Report - Optional Raw Data Files - Interpretation (Optional)
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